Study | Models | Applicability | Risk of bias | Usability | ||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|
Participant selection | Predictors | Outcome | Overall applicability | Participant selection | Predictors | Outcome | Analysis | Overall RoB | Research | Practice | ||
Knaus | APACHE II | H | L | L | H | L | L | L | H | H | y | y |
Le Gall | SAPS II | H | L | L | H | L | L | L | H | H | n | y |
Lemeshow | MPM II models | H | L | L | H | L | L | L | H | H | n | n |
Signorini | Signorini | L | L | L | L | L | L | L | H | H | n | y |
Hukkelhoven | Hukkelhoven model | L | L | L | L | L | L | L | L | L | y | y |
Maas | Rotterdam CT score | L | L | L | L | L | L | L | U | U | n | y |
Perel | CRASH models | L | L | L | L | L | L | L | U | U | n | y |
Steyerberg | IMPACT models | L | L | L | L | L | L | L | L | L | y | y |
Jacobs | Nijmegen models | L | L | L | L | L | L | L | H | H | y | y |
Yuan | Yuan models | L | L | L | L | L | U | L | H | H | n | y |